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Durability evaluation equipment Product List

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Perovskite solar cell durability evaluation device "PAS-100"

Perovskite solar cell durability evaluation device "PAS-100"

The LED driving circuit can control 4 channels! We will design the LED substrate to match the TEG.

The "PAS-100" is a durability evaluation device for perovskite solar cells that employs a Peltier element-based temperature control mechanism for each device, allowing for individual temperature control. It measures and calculates Voc, Isc, IV curves, Jsc, Pmax, FF, Rs, and Rsh, and outputs graphs and CSV files. This device enables multi-channel characterization and durability evaluation of perovskite solar cells, accelerating material research and development. 【Features】 - Long-duration continuous evaluation equivalent to 1 SUN using an LED light source - Individual temperature control for each device and temperature step function - High expandability and space-saving design with a pull-out drawer *For more details, please download the PDF or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Cells and batteries
  • Durability evaluation equipment

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Durability Evaluation Device for Perovskite Solar Cells for Solar Cell Manufacturers

Durability Evaluation Device for Perovskite Solar Cells for Solar Cell Manufacturers

Individual temperature control capable perovskite solar cell durability evaluation device

To all manufacturers of solar cells, precise temperature management and stable evaluation for the performance verification of perovskite solar cells are essential for improving product reliability. In particular, accurate understanding of durability under various environmental conditions requires meticulous temperature control tailored to the state of each individual device. Inadequate temperature management can lead to variations in evaluation results and discrepancies with actual usage environments. Our perovskite solar cell durability evaluation device, 'PAS-100', employs a Peltier element-based temperature control mechanism for each device, enabling individual temperature control. This supports high-precision performance verification. [Usage Scenarios] - Characterization evaluation of perovskite solar cells - Multi-channel measurement in durability evaluation - Acceleration of material research and development [Effects of Implementation] - Improved evaluation accuracy - Shortened research and development cycle - Enhanced product reliability

  • Other measurement, recording and measuring instruments
  • Cells and batteries
  • Durability evaluation equipment

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Durability Evaluation Device for Perovskite Solar Cells for Research Institutions

Durability Evaluation Device for Perovskite Solar Cells for Research Institutions

Accelerating material development for perovskite solar cells with individual temperature control.

In research institutions focused on material development, it is essential to accurately understand the properties of new solar cell materials and evaluate their durability. Particularly for next-generation materials like perovskite solar cells, detailed analysis of performance changes under various environmental conditions is key to advancing practical applications. Inadequate evaluation may hinder the potential of the materials and lead to delays in development. The perovskite solar cell durability evaluation device 'PAS-100' is equipped with individual temperature control functions for each device, supporting the acceleration of material research and development. 【Usage Scenarios】 - Evaluation of perovskite solar cell material properties - Long-term durability testing - Analysis of performance fluctuations due to temperature changes 【Benefits of Implementation】 - Shortening of the material development cycle - Improvement in evaluation accuracy - Acquisition of reliable data

  • Other measurement, recording and measuring instruments
  • Cells and batteries
  • Durability evaluation equipment

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Considerations on Coating Tests for Wafer Polymers for Automotive Applications

Considerations on Coating Tests for Wafer Polymers for Automotive Applications

Support for improving the quality of automotive parts through durability testing of semiconductor coatings.

In the automotive industry, the durability of coatings is extremely important to ensure the long-term reliability of parts. Particularly for components used in harsh environments, the peeling or degradation of coatings can lead to a decline in product performance or failure. Tests using Nanovia's indenter evaluate the adhesion strength of metal coatings and the durability of polymer coatings, contributing to the improvement of automotive parts quality. 【Application Scenarios】 - Evaluation of adhesion strength of metal coatings - Evaluation of durability of polymer coatings - Coating tests in high-temperature environments 【Benefits of Implementation】 - Improved reliability of parts - Increased product lifespan - Enhanced efficiency in quality control

  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Durability evaluation equipment

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Considerations on Coating Tests of Wafers and Polymers for Agriculture

Considerations on Coating Tests of Wafers and Polymers for Agriculture

Applying semiconductor technology to evaluate the environmental resistance of agricultural materials.

In the agricultural sector, the durability of materials against environmental factors such as pesticides, fertilizers, and climate change is required. In particular, coated materials are important for protecting against these environmental factors and extending product lifespan. Tests using Nanovia's indenter evaluate the adhesion strength and wear resistance of coatings, contributing to the improvement of agricultural material quality. 【Application Scenarios】 * Evaluation of coatings for pesticide spraying nozzles * Weather resistance testing of fertilizer bags' coatings * Scratch resistance evaluation of greenhouse films 【Effects of Implementation】 * Improved material durability * Enhanced product quality * Cost reduction

  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Durability evaluation equipment

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